Model: TELLUS

SPECIFICATIONS

Tube power	600/300 W (on request)
Target	Cu (Cr, Fe, Co, Mo – optional)
Cooling system	Internal water cooling: closed- circuit
Goniometer	Θ-Θ vertical, redius 150 mm
Scanning range	-6° to +154° (2θ)
Minimal step	0.001° (2θ)
Positioning accuracy	+/- 0.01° (2θ)
Scanning speed	0.01–600°/min
Weight	115 kg
Personal computer	PC with OS Windows
Interface	USB/Ethernet
Dimensions	700 x 700 x 820 (mm)

SOFTWARE PACKAGE

TELLUSCon for system control and data acquisition	Interface optimized for advanced and non-experienced users Measurement by steps or continous scan Predefined measurement scenarios Data preprocessing Measurement report
SPECIALISED SOFTWARE for advanced data analysis	Data preprocessing (virtual monochromator, Lorentz-polarization factor correction, absorption correction, smoothing, background line definition) Peak search Qualititative phase analysis Quantitative analysis with RIR and internal standard calibration methods Refinement of lattice parameters by whole pattern-fitting method (Rietveld, Pawley, Le Bail) Analysis report
Databases	COD (open-access collection) PDF-2 (optional)

ACCESSORIES

Optics	Incident beam mask Soller slits Divergence slit Direct beam absorber Set of alignment slits
Sample holders	Standard holders (deep and shallow cavities, perforated), Standard Reference material holder, glass holders
K-beta filter	Ni 0.02 mm filter for diffracted beam
Standard Reference material	NIST 1976c
Optional accessories	Anti-scattering slit Zero diffraction plate Rotating sample holder Sample changer on 8 pcs Knife edge – collimator Heating chamber Variable divergence slit (VDS) Holder for the bulk samples

X-RAY DIFFRACTOMETER -LINEV SYSTEM

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