XRF (B SERIES)- BOWMAN

Origin: America

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The B Series is a basic XRF measurement system with a top-down design for easy operation. It features a fixed sample stage, requiring users to manually align the test position using video imaging. The sample chamber is similar to the P Series but without a programmable X-Y stage. The system includes a fixed collimator, fixed-focus camera, SDD detector, and a durable micro-focus X-ray tube. Notably, the B Series can be upgraded with additional collimators or a variable-focus camera to enhance analytical flexibility.

MODEL: XRF B SERIES

SPECIFICATION

Element Range: Aluminium 13 to Uranium 92
X-ray excitation: 50 W (50kV and 1mA) micro-focused W anode tube
Detector: Silicon solid state detector with 190eV resolution or better
Number of analysis
layers and elements: 5 layers (4 layers + base) and 10 elements in each layer with composition analysis of up to 30 elements simultaneously
Filters/Collimators: 4 primary filters/single motorized collimators
Focal Depths: Fixed focal depths with laser (optional multi focal)
Digital Pulse Processing: 4096 CH digital multi-channel analyser with flexible shaping time. Automatic signal processing including dead time correction and escape peak correction
Computer: Intel CORE i5 9th gen. desktop processor, solid state hard drive, 16GB RAM, Microsoft Windows 11 Professional 64bit equivalent
Camera optics: 1/4″ (6mm) CMOS-1280×720 VGA resolution
Video Magnification: 30X Micro & 7X Digital Zoom: Standard; 55X Micro: Optional
Power Supply: 150W, 100-240 volts, with frequency range of 47Hz to 63Hz
Weight: 34kg
Standard Motorized/ Programmable XY: Table size: Not available
Extended Programmable XY: Table size: Not available
Internal Dimensions: Height: 140mm (5.5″), Width: 305mm (12″), Depth: 330mm (13″)
External Dimensions: Height: 457mm (18″), Width: 457mm (18″), Depth: 610mm ( 24″)

 

 

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XRF (B SERIES)- BOWMAN

The B Series is a basic XRF measurement system with a top-down design for easy operation. It features a fixed sample stage, requiring users to manually align the test position using video imaging. The sample chamber is similar to the P Series but without a programmable X-Y stage. The system includes a fixed collimator, fixed-focus camera, SDD detector, and a durable micro-focus X-ray tube. Notably, the B Series can be upgraded with additional collimators or a variable-focus camera to enhance analytical flexibility.

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