XRF (L SERIES)- BOWMAN

Origin: America

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The Bowman L Series is a versatile XRF instrument with a large sample chamber (22″ x 24″ x 13″) and 10″ x 10″ X-Y stage travel. It accommodates large parts or multiple samples and includes a 4-position collimator assembly, variable focus camera, and programmable X-Y stage. The chamber Z-height is 10″ (or 13″ without the stage). It features an SDD detector and a long-life micro-focus X-ray tube.

MODEL: L SERIES

SPECIFICATION

Element Range: Aluminium 13 to Uranium 92
X-ray excitation: 50 W (50kV and 1mA) micro-focused with anode tube
Detector: Silicon solid state detector with 190eV resolution or better
Number of analysis
layers and elements: 5 layers (4 layers + base) and 10 elements in each layer with composition analysis of up to 30 elements simultaneously
Filters/Collimators: 4 primary filters / 4 motorized collimators
Focal Depths: Multi fixed focal depths with laser
Digital Pulse Processing: 4096 CH digital multi-channel analyzer with flexible shaping time; automatic signal processing including dead time correction and escape peak correction
Computer: Intel CORE i5 9th gen. desktop processor, solid state hard drive, 16GB RAM, Microsoft Windows 11 Professional 64bit equivalent
Camera optics: 1/4″ (6mm) CMOS-1280×720 VGA resolution
Video Magnification: 30X Micro & 7X Digital Zoom: Standard; 55X Micro: Optional
Now available with optional dual camera tableview
Power Supply: 150W, 100-240 volts, with frequency range of 47Hz to 63Hz
Working Environment: 50°F (10°C) to 104°F (40°C) and up to 98% RH, non-condensing
Weight: 110kg
Programmable XY: Table size: 254mm (10″) x 254mm (10″) | Travel: 254mm (10″) x 254mm (10″)
Internal Dimensions: Height: 254mm (10″), Width: 559mm (22″), Depth: 610mm (24″)
External Dimensions: Height: 762mm (30″), Width: 711mm (28″), Depth: 762mm (30″)

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XRF (L SERIES)- BOWMAN

The Bowman L Series is a versatile XRF instrument with a large sample chamber (22″ x 24″ x 13″) and 10″ x 10″ X-Y stage travel. It accommodates large parts or multiple samples and includes a 4-position collimator assembly, variable focus camera, and programmable X-Y stage. The chamber Z-height is 10″ (or 13″ without the stage). It features an SDD detector and a long-life micro-focus X-ray tube.

XRF (M SERIES)- BOWMAN

The M Series delivers high-performance plating thickness measurement for the smallest features, using advanced poly-capillary optics that focus the x-ray beam down to 7.5μm FWHM. It includes a 140x high-magnification camera with enhanced digital zoom, paired with a secondary macro camera for easy navigation. The high-precision programmable X-Y stage enables multi-point measurements, with automatic pattern recognition and 2D mapping for surface topography analysis. The standard setup features 15μm optics, a high-resolution LSDD detector, and a programmable X-Y stage. Due to its close focal distance, samples must be flat.

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