Showing all 2 results

EM-30N is our most popular model of tungsten filament-based tabletop Scanning Electron Microscope (SEM). With 5th generation DSP (Digital Signal Processing) technology, it delivers sharp, low-noise images even at high magnification. Panorama Mode enables wide-area scanning, while LV (Low Vacuum) allows you to capture high-quality, clear images of non-conductive samples without the need for conductive coating. EM-30N is also the world's first tabletop SEM that seamlessly integrates with a compact EBSD system, significantly enhancing its versatility and performance.

The EM-40 is a next-generation scanning electron microscope (SEM) that offers high-resolution sample observation and outstanding features, enhancing analytical and research efficiency.

error: Content is protected !!