GLOVEBOX (KK-021AS) – KIYON

The SCHMIDT + HAENSCH electronic reflectance-meter for automatic color grading of crystalline sugar according to recommendations of ICUMSA, method GS2-11 (1994) and GS2-13 (1994). With this instrument the reflectance factors at 495 nm and 620 nm are measured and the ratio is indicated in terms of color type numbers. The consistent use of high integrated circuits, very little heating, and easily detachable lighting unit ensure that the Saccharoflex 2020 is a reliable and easily maintainable measurement system which corresponds to the high SCHMIDT + HAENSCH quality standard. Ceramic calibration standards are also available.

Our VariRef refractometer ensures high precision throughout the product lifecycle, supporting multi-point calibration for an extended measurement range. With rapid temperature control and an adjustable sample compartment, it measures both liquid and solid samples. All VariFamily devices can connect to web browsers on any device. Additionally, a pharma-ready module compliant with 21 CFR Part 11 is available, including full documentation and options.

The G Series XRF is an ideal choice for laboratories and production lines, especially for users with limited workspace, budget constraints, or a preference for "bottom to top" operation with motorized Z-axis control. Designed to efficiently analyze small samples quickly and easily, this system offers flexibility and high performance in material inspection and evaluation.

The W Series Micro XRF from Bowman features a 7.5 µm FWHM X-ray beam, the smallest in the world for coating thickness analysis using XRF technology. This makes it ideal for measuring small components like BGAs and solder bumps. It includes a dual-camera system with 140X magnification for precision imaging and a secondary camera for live viewing. A programmable X-Y stage with ±1 µm accuracy, along with pattern recognition and auto-focus, enables precise measurements and automated multi-point analysis. The system also offers 3D mapping for coating topography visualization. Standard configurations include a molybdenum anode tube (with optional chromium or tungsten) and a high-resolution Silicon Drift Detector. The instrument can measure up to five coating layers simultaneously and operates with Archer software, which streamlines measurement, reporting, and application setup.

The K Series is a high-precision XRF system designed for diverse sample analysis, featuring a large 12″ x 12″ measurable area, programmable X-Y stage, and auto multi-collimator for flexible spot sizes. Its variable-focus camera (0.25″ to 3.5″) and table view navigation enable effortless measurements. For ultra-small features, the poly-capillary optics version offers 15μm resolution, high-precision stage (2µm), and 140x magnification camera with digital zoom. Equipped with an SDD detector and long-life X-ray tube, it ensures accuracy and compliance with ASTM B568, ISO 3497, and IPC-4552

The B Series is a basic XRF measurement system with a top-down design for easy operation. It features a fixed sample stage, requiring users to manually align the test position using video imaging. The sample chamber is similar to the P Series but without a programmable X-Y stage. The system includes a fixed collimator, fixed-focus camera, SDD detector, and a durable micro-focus X-ray tube. Notably, the B Series can be upgraded with additional collimators or a variable-focus camera to enhance analytical flexibility.

SCHMIDT + HAENSCH VariPol is a polarimeter that measures optical rotation with the highest accuracy and speed. The device is specially designed for applications in the pharmaceutical industry but can also be customized for other purposes. The superior measurement accuracy of VariPol, combined with its modularity, flexibility, and high speed, makes it a standout instrument. Its advanced connectivity allows seamless integration into your system and supports result monitoring through the Aquisys software on a smartphone or tablet.