RAMAN-SEM MICROSCOPES (RISE) – OXFORD INSTRUMENTS (WITec)

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The Raman-SEM microscope is the world’s first fully integrated system combining Raman spectroscopy and Scanning Electron Microscopy (SEM) in a single instrument.
With its novel correlative microscopy approach, RISE merges the ultrastructural surface analysis capability of SEM with molecular compound information from confocal Raman imaging. The system enables seamless switching between Raman and SEM measurements, supported by a user-friendly software interface for intuitive control.
The RISE microscope not only maintains the full performance of both techniques but also provides precise correlation between the measurement results.

RAMAN-SEM MICROSCOPES (RISE) – OXFORD INSTRUMENTS (WITec)

THE RISE TECHNIQUE:

For RISE microscopy, samples are automatically transferred from one measuring position to the other within the vacuum chamber of the SEM, streamlining the workflow and drastically improving the instrument’s ease of use.

RISE KEY FEATURES:

Scanning Electron Microscopy

Confocal Raman Microscopy

Scanning Electron Microscopy features a variety of analysis techniques. With RISE, the chemistry of molecular compounds can be imaged additionally.
  • Confocal Raman Imaging with unprecedented performance in speed, sensitivity, and resolution
  • Hyperspectral image generation with the information of a complete Raman spectrum at every image pixel
  • Excellent diffraction-limited lateral resolution of 200 – 300 nm
  • Outstanding depth resolution ideally suited for 3D image generation and depth profiles
  • Ultrahigh-throughput lens-based spectroscopic system for highest sensitivity and best performance in spectral resolution
  • Ultra-fast Raman imaging option with only 0.76 ms integration time per spectrum
    Non-destructive imaging technique: no staining or fixation of the sample required

ỨNG DỤNG THỰC TẾ:

Raman-SEM image overlay of a hamster brain tissue sample. Color-coded Raman image parameters: Green: White brain matter; Red: Gray brain matter; 100 µm x 100 µm, 300 x 300 pixels = 90,000 spectra, 50 ms integration time per spectrum. Raman-SEM image overlay of a GaAs semiconductor sample. Color-coded Raman image parameters: Yellow: Gold substrate; Red: GaAs; Blue: Residues from production; 50 µm x 50 µm, 300 x 300 pixels = 90,000 spectra, 34 ms integartion time per spectrum. Raman-SEM image overlay of a PMMA-PS polymer blend- Color-coded Raman image parameters: Green: Polystyrene; Red: Polymethyl methacrylate.

RISE Microscopy and EDX analysis of a geological sample. Left: Overlaid SEM-EDX image: Three different element groups can be distinguished (Orange: Si, O; Purple: Si, Al, Fe, Ca; Green: Na). Middle: The Raman-SEM image overlay of the same sample area shows the distribution of the molecular compounds. Right: Corresponding Raman spectra.

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RAMAN-SEM MICROSCOPES (RISE) – OXFORD INSTRUMENTS (WITec)

The Raman-SEM microscope is the world’s first fully integrated system combining Raman spectroscopy and Scanning Electron Microscopy (SEM) in a single instrument. With its novel correlative microscopy approach, RISE merges the ultrastructural surface analysis capability of SEM with molecular compound information from confocal Raman imaging. The system enables seamless switching between Raman and SEM measurements, supported by a user-friendly software interface for intuitive control. The RISE microscope not only maintains the full performance of both techniques but also provides precise correlation between the measurement results.