RAMAN-SNOM MICROSCOPE (alpha300 RS) – OXFORD INSTRUMENTS (WITec)

Origin: Germany

Brand:

Category: Thương hiệu:

For the user with challenging experimental requirements, the alpha300 RS facilitates confocal Raman imaging in combination with Scanning Near-field Optical Microscopy for optical imaging with resolution beyond the diffraction limit.

It combines all features of the alpha300 S and alpha300 R and many AFM operation modes. Furthermore the combined Raman-SNOM microscope is ideally suited for high-resolution Raman imaging techniques such as nearfield-Raman imaging.

 

RAMAN-SNOM MICROSCOPE (alpha300 RS) – OXFORD INSTRUMENTS (WITec)

KEY FEATURES:

  • All features of the alpha300 R (Raman) and the alpha300 S (SNOM) microscope provided in one instrument
  • Excellent combination of high-resolution surface imaging (SNOM) and chemical imaging (Raman)
  • Ideally suited for combined techniques such as near-field Raman imaging
  • Convenient switching between the measurement techniques is realized by a rotation of the objective turret
  • Sample movement between the measurements not necessary

SPECIFICATIONS:

Raman General Operation Modes

SNOM Operation Modes
  • Raman spectral imaging: acquisition of a complete Raman spectra at every image pixel
  • Planar (x-y-direction) and depth scans (z-direction) with manual sample positioning
  • Image stacks: 3D confocal Raman imaging
  • Time series
  • Single point Raman spectrum acquisition
  • Single-point depth profiling
  • Fibre-coupled UHTS spectrometer specifically designed for Raman microsopy and applications with low light intensities
  • Confocal Fluorescence Microscopy
  • Bright Field Microscopy
  • Scanning Near-field Optical Microscopy (SNOM) modes: bottom-up and top-down mode, collection mode
  • Confocal Microscopy (CM) modes:
  1. Transmission
  2. Reflection
  3. Fluorescence (optional)
  4. SNOM-AFM combinations: AFM operation modes of alpha300 A included or optional available
  5. Acquisition of force-distance curves and light-distance curves
  6. Fixed-bottom illumination
  7. Total internal reflection illumination (optional)

 

Basic Microscope Features

Raman Optional/Upgradable Operation modes
  • Research grade optical microscope with 6x objective turret
  • Video system: video CCD camera
  • High sensitivity b/w video camera to view sample and SNOM/AFM tip in transmission
  • LED white-light source for Köhler illumination of AFM tip and sample
  • Manual sample positioning in x- and y-direction
  • Microscope base with active vibration isolation system
  • Fibre coupling
  • Additional lasers, several wavelenghts eligible
  • Additional UHTS spectrometers (UV, VIS, NIR)
  • Automated, motorized sample positioning and measuring with piezo-driven scan stages
  • Automated confocal Raman imaging
  • Automated multi-area and multi-point measurements
  • Ultrafast Raman imaging (1300 spectra per second) optionally available
  • Upgradable for epi-fluorescence applications
  • Adapter for higher samples
  • TrueSurface for Raman depth profiling
  • Autofocus

 

AFM Operation Modes

Computer Interface
  • Contact Mode
  • Lateral Force Mode
  • Others optional
  • WITec software suite for instrument and measurement control, data evaluation and processing

APPLICATION EXAMPLES:

Left: Topography image of exfoliated graphene simultaneously determined during the nearfield-Raman measurement with corresponding topography curve measured along the blue line.

Right: Nearfield-Raman image of the same sample area of the G-band intensity with corresponding intensity graph measured along the red line.

Related products

AUTOMATED RAMAN IMAGING MICROSCOPE (alpha300 apyron) - OXFORD INSTRUMENTS (WITec)

Microscope

AUTOMATED RAMAN IMAGING MICROSCOPE (alpha300 apyron) – OXFORD INSTRUMENTS (WITec)

The alpha300 apyron is an advanced Raman microscope system that fully automates the control and measurement processes, saving time and enhancing accuracy. With automated measurement capabilities and high-level optimization, the alpha300 apyron delivers Raman images with exceptional sensitivity and resolution, making it an ideal solution for material research and analytical applications.

ATOMIC FORCE MICROSCOPE NX10- PARK SYSTEMS

Microscope

ATOMIC FORCE MICROSCOPE NX10- PARK SYSTEMS

Park NX10 is a flagship atomic force microscope (AFM) designed for small-sample research, delivering unmatched accuracy, reliability, and ease of use. As Park Systems’ original small-sample AFM, it has earned global recognition in both academic and industrial laboratories for producing precise, repeatable nanoscale measurements. At the core of the NX10 are Park’s proprietary orthogonal scan system and True Non-contact™ mode, innovations that virtually eliminate lateral motion artifacts while protecting both tip and sample. Together, these technologies ensure artifact-free, high-resolution imaging even for the most delicate or challenging samples. From materials science to polymers and bioengineering, NX10 delivers robust performance and dependable results, making it a trusted platform for advanced nanoscale metrology.

RAMAN-SEM MICROSCOPES (RISE) - OXFORD INSTRUMENTS (WITec)

Microscope

RAMAN-SEM MICROSCOPES (RISE) – OXFORD INSTRUMENTS (WITec)

The Raman-SEM microscope is the world’s first fully integrated system combining Raman spectroscopy and Scanning Electron Microscopy (SEM) in a single instrument. With its novel correlative microscopy approach, RISE merges the ultrastructural surface analysis capability of SEM with molecular compound information from confocal Raman imaging. The system enables seamless switching between Raman and SEM measurements, supported by a user-friendly software interface for intuitive control. The RISE microscope not only maintains the full performance of both techniques but also provides precise correlation between the measurement results.

ELECTRICAL MODES- DUAL FREQUENCY RESONANCE TRACKING-PIEZORESPONSE FORCE MICROSCOPY (DFRT-PFM)- PARK SYSTEMS

Microscope

ELECTRICAL MODES- DUAL FREQUENCY RESONANCE TRACKING-PIEZORESPONSE FORCE MICROSCOPY (DFRT-PFM)- PARK SYSTEMS

High-sensitivity piezoresponse imaging using dual-frequency resonance tracking for precise analysis of complex domain structures and electromechanical behavior.

IMAGING MODES- CONTACT MODE- PARK SYSTEMS

Microscope

IMAGING MODES- CONTACT MODE- PARK SYSTEMS

High-resolution surface imaging of samples without physical contact, minimizing damage during scanning.

IMAGING MODES- TAPPING MODE- PARK SYSTEMS

Microscope

IMAGING MODES- TAPPING MODE- PARK SYSTEMS

In this alternative technique to non-contact mode, the cantilever again oscillates just above the surface, but at a much higher amplitude of oscillation. The bigger oscillation makes the deflection signal large enough for the control circuit, and hence an easier control for topography feedback. It produces modest AFM results but blunts the tip’s sharpness at a higher rate, ultimately speeding up the loss of its imaging resolution.

IMAGING MODES- TRUE NON-CONTACT™ MODE- PARK SYSTEMS

Microscope

IMAGING MODES- TRUE NON-CONTACT™ MODE- PARK SYSTEMS

High-resolution surface imaging of samples without physical contact, minimizing damage during scanning.

ATOMIC FORCE MICROSCOPE FX40- PARK SYSTEMS

Microscope

ATOMIC FORCE MICROSCOPE FX40- PARK SYSTEMS

Park FX40 is Park Systems’ latest innovation in atomic force microscopy (AFM), designed for high-resolution imaging of small samples. With a low noise floor, minimal thermal drift, and enhanced mechanical stability, the FX40 delivers unmatched precision and reliability. Like all Park AFMs, FX40 features an orthogonal scan system and True Non-contact™ mode, enabling accurate, high-resolution metrology, even on the most delicate or fragile samples.​ Key features of FX40 include automatic probe exchange, automatic laser beam alignment, and a sample-view camera; the signatures of FX-series AFMs that streamline operation while significantly enhancing productivity. With the powerful FX AFM controller featuring an 8-channel lock-in amplifier and 5 MHz bandwidth for advanced signal processing, FX40 supports a wide range of cutting-edge modes and options. Built for both precision and ease of use, the FX40 is the ideal solution for nanoscale imaging and analysis.

Sản phẩm đã xem

LABORATORY REFRIGERATORS – NEWTRONIC

The Newtronic NLCC Series laboratory refrigerators offer capacities ranging from 200L to 2000L, with spacious chambers and 3 to 10 shelves to suit all sample storage needs. Their versatile size options make them ideal for both compact laboratories and large-scale operations.

AUTOMATED HPTLC SAMPLE APPLICATOR – BIOSTEP BY BIONIS

The FAS305 Automated HPTLC Sample Applicator is a fully automated system combining the AS30 applicator and BS35 auto-sampler, capable of handling up to 80 samples for precise and consistent application on TLC plates. Its space-saving design, automated cleaning, and user-friendly software make it an ideal solution for high-throughput HPTLC analysis with minimal manual intervention.

HAST TEST CHAMBER / ACCELERATED STRESS TEST CHAMBER

The HAST (Highly Accelerated Stress Test) pressure-temperature-humidity chamber is specialized equipment designed to evaluate product durability, stability, and lifespan under controlled harsh environmental conditions. This chamber enables rapid aging simulation within short timeframes, allowing assessment of product changes when exposed to elevated temperature, humidity, and pressure levels.

error: Content is protected !!