ATOMIC FORCE MICROSCOPE FX40- PARK SYSTEMS

ATOMIC FORCE MICROSCOPE FX40- PARK SYSTEMS - Image 2

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ATOMIC FORCE MICROSCOPE FX40- PARK SYSTEMS

Origin: Korea

Brand: PARK SYSTEMS

Category: Microscope Tags: Electronics, Materials Thương hiệu: PARK SYSTEMS

Tags: Electronics, Materials

Park FX40 is Park Systems’ latest innovation in atomic force microscopy (AFM), designed for high-resolution imaging of small samples. With a low noise floor, minimal thermal drift, and enhanced mechanical stability, the FX40 delivers unmatched precision and reliability. Like all Park AFMs, FX40 features an orthogonal scan system and True Non-contact™ mode, enabling accurate, high-resolution metrology, even on the most delicate or fragile samples. Key features of FX40 include automatic probe exchange, automatic laser beam alignment, and a sample-view camera; the signatures of FX-series AFMs that streamline operation while significantly enhancing productivity. With the powerful FX AFM controller featuring an 8-channel lock-in amplifier and 5 MHz bandwidth for advanced signal processing, FX40 supports a wide range of cutting-edge modes and options. Built for both precision and ease of use, the FX40 is the ideal solution for nanoscale imaging and analysis.

Product Details

MODEL: FX40

Superior FX Mechanical Design

The FX-series AFMs are designed for minimal mechanical noise. The optical microscope is decoupled from the Z stage, lowering the weight on the Z stage and thus reducing susceptibility to mechanical disturbances. The Z stage itself is built more robustly with a high-stiffness cross-roller guide and two bearing blocks.

Constructed with materials of low thermal expansion coefficients mitigates thermal drift, the FX40 delivers reliable performance over time.

FX Laser Beam Path

The FX optics structure integrates a fiber-coupled laser (superluminescent diode; SLD) into the optical microscope assembly. The laser beam is focused through the objective lens and remains fixed at the center of the optical field of view.

Automatic Laser Beam Alignment

The vision-guided alignment system detects the cantilever shape and position and then moves the optics XY stage to align the cantilever at the center of the field of view, precisely where the laser beam is focused. Two precision motors in the FX scan head adjust the steering mirror to align the laser beam in the center of the position-sensitive photodetector (PSPD).

Automated laser beam alignment combined with automatic PSPD centering reduces setup time, ensures consistent alignment, and makes operation smooth for both new and experienced users.

Automatic Probe Exchange

AFM probe exchange can be challenging, even for experienced users, and can often lead to cantilever breakage, increasing setup time and consumable costs. Park AFMs address this difficulty by using pre-aligned probe chip carriers with kinematic mounting points for reliable and consistent tip positioning.

Each chip carrier is marked with a QR code containing detailed information, including probe type, serial number, date manufactured, and specifications.

The FX head’s Z scanner features three precision ball seats for kinematic mounting, complemented by magnets at the base to ensure a secure, reliable, and repeatable mounting position.

The automatic tip exchanger (ATX) module stores up to 8 pre-mounted probes. After the ATX camera scans the probes’ QR codes, the SmartScan™ AFM operating software displays probe information for each slot, allowing the user to select full or vacant probe slots with a simple mouse click.

After a slot is selected, the AFM head moves down to pick the probe up from or park the currently mounted probe into the slot, depending on the position of the strong magnet underneath.

Sample-View Camera

The sample-view camera provides a captured image of the sample, allowing users to simply point and click to move the XY stage. This enables convenient navigation to areas of interest and easy return to the same location.

Improved On-Axis Optics

The unobstructed optical microscope provides a clear field of view and can resolve line widths down to 0.87 μm.

Park AFM Technology

Orthogonal Scan System

Conventional AFMs with tube scanners suffer from out-of-plane motion and axes crosstalk, resulting in image distortion, especially over large scan areas. FX40, like all Park AFMs, employs an advanced orthogonal scan system featuring a flexure-guided architecture: a 2D flexure scanner moves the sample in the XY plane, while a separate 1D flexure scanner independently controls the probe’s Z-axis motion. This separated scanner system ensures highly orthogonal, linear scans with minimal out-of-plane motion and fast dynamic performance. Equipped with low-noise optical sensors for XY feedback and an ultra-low-noise strain gauge sensor for Z control, a closed-loop servo control system ensures precise and repeatable scanning across all axes.

The XY scanner is designed to achieve flat, purely horizontal motion without vertical interference by using stacked piezo actuators and flexure hinge structures. A position sensor is located at the center of the scanner to provide direct feedback for servo control, minimizing positioning errors across the scan area. This design ensures consistent accuracy and stability, even when scanning large samples.

Park AFM Technology

True Non-Contact™ Mode

FX40 features True Non-contact™ mode, a proprietary technology exclusively offered by Park Systems. True Non-contact mode obtains topography by detecting the attractive van der Waals force between the AFM tip and the sample surface.

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