X-RAY DIFFRACTOMETER -LINEV SYSTEM

Origin: America

Brand:

Category: Thương hiệu:

The TELLUS X-Ray Diffractometer is an outstanding desktop device that combines advanced detectors and durable X-ray sources. With its rapid and precise analysis capabilities, TELLUS delivers high-quality data even with small samples. Its user-friendly software interface makes it easy for both newcomers and experts to operate.

Model: TELLUS

SPECIFICATIONS

Tube power 600/300 W (on request)
Target Cu (Cr, Fe, Co, Mo – optional)
Cooling system Internal water cooling: closed- circuit
Goniometer Θ-Θ vertical, redius 150 mm
Scanning range -6° to +154° (2θ)
Minimal step 0.001° (2θ)
Positioning accuracy +/- 0.01° (2θ)
Scanning speed 0.01–600°/min
Weight 115 kg
Personal computer PC with OS Windows
Interface USB/Ethernet
Dimensions 700 x 700 x 820 (mm)

 

Dectris Mythen2 R 1D Advacam MiniPIX TPX 3
Pixel size 50 µm x 8 mm 55 x 55 µm
Type / number of pixels Tuyến tính 1D / 640 Ma trận 2D / 250×250
Energy range (keV) 4-40 2-60
Mode Ngưỡng đơn Ngưỡng đôi
Frame rate (Hz) 100 16
Cooling Không khí
Module weight (g) 100 41

 

SOFTWARE PACKAGE

TELLUSCon
for system control and data acquisition
  • Interface optimized for advanced and non-experienced users
  • Measurement by steps or continous scan
  • Predefined measurement scenarios
  • Data preprocessing
  • Measurement report
SPECIALISED SOFTWARE
for advanced data analysis
  • Data preprocessing (virtual monochromator, Lorentz-polarization factor correction, absorption correction, smoothing, background line definition)
  • Peak search
  • Qualititative phase analysis
  • Quantitative analysis with RIR and internal standard calibration methods
  • Refinement of lattice parameters by whole pattern-fitting method (Rietveld, Pawley, Le Bail)
  • Analysis report
Databases
  • COD (open-access collection)
  • PDF-2 (optional)

 

ACCESSORIES

Optics
  • Incident beam mask
  • Soller slits
  • Divergence slit
  • Direct beam absorber
  • Set of alignment slits
Sample holders        Standard holders (deep and shallow cavities, perforated),

Standard Reference material holder, glass holders
K-beta filter         Ni 0.02 mm filter for diffracted beam
Standard Reference material         NIST 1976c
Optional accessories
  • Anti-scattering slit
  • Zero diffraction plate
  • Rotating sample holder
  • Sample changer on 8 pcs
  • Knife edge – collimator
  • Heating chamber
  • Variable divergence slit (VDS)
  • Holder for the bulk samples

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