XRF (G SERIES) – BOWMAN

The G Series XRF is an ideal choice for laboratories and production lines, especially for users with limited workspace, budget constraints, or a preference for “bottom to top” operation with motorized Z-axis control. Designed to efficiently analyze small samples quickly and easily, this system offers flexibility and high performance in material inspection and evaluation.

KEY FEATURES

  • The two most outstanding features of the G Series are its precise video imaging system and “bottom-to-top” measurement with a motorized Z-axis, combined with laser autofocus.
  • An optional manual XY stage, with a travel range of 1.5″ x 1.5″, enables easy positioning of both small and large components.

CONFIGURATION

  • The standard configuration includes a single fixed collimator and a fixed-focus camera.
  • An integrated silicon solid-state detector (SDD) is paired with an ultra-durable X-ray tube.
  • Like all Bowman benchtop XRF systems, this device can be upgraded to include multiple collimators or a variable-focus camera.

TECHNICAL SPECIFICATIONS

  • X-ray Excitation: 50 W (50kV and 1mA), ultra-micro W tube.
  • Detector: Silicon solid-state detector with 190eV resolution or better.
  • Focal Depth: Single fixed focus with laser and autofocus.
  • Video Magnification:
  • 30x Micro: Standard.
  • 55x Micro: Optional.
  • 7x Digital Zoom: Standard.
  • OPERATING ENVIRONMENT:
  • Temperature: 50°F (10°C) to 104°F (40°C).
  • Humidity: Up to 98%, non-condensing.
  • Weight: 25 kg.
  • Optional Manual XY Stage:
  • Stage Size: 11″ x 10″.
  • Travel Range: 1.5″ x 1.5″.

ELEMENTAL ANALYSIS

  • Element Range: From Aluminum (13) to Uranium (92).
  • Layer Analysis: 5 layers (4 layers + substrate) and up to 10 elements per layer.
  • Composition Analysis: Up to 25 elements simultaneously.
  • FILTERS & COLLIMATORS:
  • 4 Primary Filters / 1 Collimator (optional 2-collimator configuration).
  • DIGITAL PULSE PROCESSING:
  • 4096-channel digital multi-channel analyzer with flexible shaping time.
  • Automatic signal processing, including dead-time correction and escape peak correction.

PROCESSOR & SOFTWARE

  • Processor: Intel CORE i5 3470 (3.2GHz), 8GB DDR3 RAM.
  • Operating System: Windows 10 Pro, 64-bit.
  • Camera Optics: 1/4″ CMOS, 1280×720 VGA resolution.

POWER SUPPLY: 150W, 100~240V, 47Hz – 63Hz.
DIMENSIONS:

  • Internal Dimensions: 100mm (4″), 325mm (13″), 300mm (12″).
  • External Dimensions: 325mm (13″), 350mm (14″), 450mm (18″).

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The G Series XRF is an ideal choice for laboratories and production lines, especially for users with limited workspace, budget constraints, or a preference for "bottom to top" operation with motorized Z-axis control. Designed to efficiently analyze small samples quickly and easily, this system offers flexibility and high performance in material inspection and evaluation.

The Bowman L Series is a versatile XRF instrument with a large sample chamber (22″ x 24″ x 13″) and 10″ x 10″ X-Y stage travel. It accommodates large parts or multiple samples and includes a 4-position collimator assembly, variable focus camera, and programmable X-Y stage. The chamber Z-height is 10″ (or 13″ without the stage). It features an SDD detector and a long-life micro-focus X-ray tube.

The M Series delivers high-performance plating thickness measurement for the smallest features, using advanced poly-capillary optics that focus the x-ray beam down to 7.5μm FWHM. It includes a 140x high-magnification camera with enhanced digital zoom, paired with a secondary macro camera for easy navigation. The high-precision programmable X-Y stage enables multi-point measurements, with automatic pattern recognition and 2D mapping for surface topography analysis. The standard setup features 15μm optics, a high-resolution LSDD detector, and a programmable X-Y stage. Due to its close focal distance, samples must be flat.

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