XRF (G SERIES) – BOWMAN

The G Series XRF is an ideal choice for laboratories and production lines, especially for users with limited workspace, budget constraints, or a preference for “bottom to top” operation with motorized Z-axis control. Designed to efficiently analyze small samples quickly and easily, this system offers flexibility and high performance in material inspection and evaluation.

KEY FEATURES

  • The two most outstanding features of the G Series are its precise video imaging system and “bottom-to-top” measurement with a motorized Z-axis, combined with laser autofocus.
  • An optional manual XY stage, with a travel range of 1.5″ x 1.5″, enables easy positioning of both small and large components.

CONFIGURATION

  • The standard configuration includes a single fixed collimator and a fixed-focus camera.
  • An integrated silicon solid-state detector (SDD) is paired with an ultra-durable X-ray tube.
  • Like all Bowman benchtop XRF systems, this device can be upgraded to include multiple collimators or a variable-focus camera.

TECHNICAL SPECIFICATIONS

  • X-ray Excitation: 50 W (50kV and 1mA), ultra-micro W tube.
  • Detector: Silicon solid-state detector with 190eV resolution or better.
  • Focal Depth: Single fixed focus with laser and autofocus.
  • Video Magnification:
  • 30x Micro: Standard.
  • 55x Micro: Optional.
  • 7x Digital Zoom: Standard.
  • OPERATING ENVIRONMENT:
  • Temperature: 50°F (10°C) to 104°F (40°C).
  • Humidity: Up to 98%, non-condensing.
  • Weight: 25 kg.
  • Optional Manual XY Stage:
  • Stage Size: 11″ x 10″.
  • Travel Range: 1.5″ x 1.5″.

ELEMENTAL ANALYSIS

  • Element Range: From Aluminum (13) to Uranium (92).
  • Layer Analysis: 5 layers (4 layers + substrate) and up to 10 elements per layer.
  • Composition Analysis: Up to 25 elements simultaneously.
  • FILTERS & COLLIMATORS:
  • 4 Primary Filters / 1 Collimator (optional 2-collimator configuration).
  • DIGITAL PULSE PROCESSING:
  • 4096-channel digital multi-channel analyzer with flexible shaping time.
  • Automatic signal processing, including dead-time correction and escape peak correction.

PROCESSOR & SOFTWARE

  • Processor: Intel CORE i5 3470 (3.2GHz), 8GB DDR3 RAM.
  • Operating System: Windows 10 Pro, 64-bit.
  • Camera Optics: 1/4″ CMOS, 1280×720 VGA resolution.

POWER SUPPLY: 150W, 100~240V, 47Hz – 63Hz.
DIMENSIONS:

  • Internal Dimensions: 100mm (4″), 325mm (13″), 300mm (12″).
  • External Dimensions: 325mm (13″), 350mm (14″), 450mm (18″).

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The W Series Micro XRF from Bowman features a 7.5 µm FWHM X-ray beam, the smallest in the world for coating thickness analysis using XRF technology. This makes it ideal for measuring small components like BGAs and solder bumps. It includes a dual-camera system with 140X magnification for precision imaging and a secondary camera for live viewing. A programmable X-Y stage with ±1 µm accuracy, along with pattern recognition and auto-focus, enables precise measurements and automated multi-point analysis. The system also offers 3D mapping for coating topography visualization. Standard configurations include a molybdenum anode tube (with optional chromium or tungsten) and a high-resolution Silicon Drift Detector. The instrument can measure up to five coating layers simultaneously and operates with Archer software, which streamlines measurement, reporting, and application setup.

The K Series is a high-precision XRF system designed for diverse sample analysis, featuring a large 12″ x 12″ measurable area, programmable X-Y stage, and auto multi-collimator for flexible spot sizes. Its variable-focus camera (0.25″ to 3.5″) and table view navigation enable effortless measurements. For ultra-small features, the poly-capillary optics version offers 15μm resolution, high-precision stage (2µm), and 140x magnification camera with digital zoom. Equipped with an SDD detector and long-life X-ray tube, it ensures accuracy and compliance with ASTM B568, ISO 3497, and IPC-4552

The B Series is a basic XRF measurement system with a top-down design for easy operation. It features a fixed sample stage, requiring users to manually align the test position using video imaging. The sample chamber is similar to the P Series but without a programmable X-Y stage. The system includes a fixed collimator, fixed-focus camera, SDD detector, and a durable micro-focus X-ray tube. Notably, the B Series can be upgraded with additional collimators or a variable-focus camera to enhance analytical flexibility.

SCHMIDT + HAENSCH VariPol is a polarimeter that measures optical rotation with the highest accuracy and speed. The device is specially designed for applications in the pharmaceutical industry but can also be customized for other purposes. The superior measurement accuracy of VariPol, combined with its modularity, flexibility, and high speed, makes it a standout instrument. Its advanced connectivity allows seamless integration into your system and supports result monitoring through the Aquisys software on a smartphone or tablet.

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