XRF (K SERIES)- BOWMAN

Origin: America

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The K Series is a high-precision XRF system designed for diverse sample analysis, featuring a large 12″ x 12″ measurable area, programmable X-Y stage, and auto multi-collimator for flexible spot sizes. Its variable-focus camera (0.25″ to 3.5″) and table view navigation enable effortless measurements. For ultra-small features, the poly-capillary optics version offers 15μm resolution, high-precision stage (2µm), and 140x magnification camera with digital zoom. Equipped with an SDD detector and long-life X-ray tube, it ensures accuracy and compliance with ASTM B568, ISO 3497, and IPC-4552

MODEL: XRF K SERIES

SPECIFICATION

Element Range: Aluminium 13 to Uranium 92
X-ray excitation: 50 W (50kV and 1mA) micro-focused W anode tube (Cr, Mo, Rh anodes available)
Detector: Collimated: Silicon solid state detector with 190eV resolution or better

Optics: Large Window Silicon solid state detector with 190eV resolution or better

Number of analysis layers and elements: 5 layers (4 layers + base) and 10 elements in each layer. Composition analysis of up to 30 elements simultaneously
Filters/Collimators: Collimated: 4 primary filters / 4 motorized collimators

Optics: 4 primary filters

Focal Depths: Collimated: Multi fixed focal depths with laser and image autofocus

Optics: Output Focal Depth Fixed at 0.15″ (3.81mm)

Digital Pulse Processing: 4096 CH digital multi-channel analyzer with flexible shaping time. Automatic signal processing including dead time correction and escape peak correction
Computer: Intel CORE i5 9th gen. desktop processor, solid state hard drive, 16GB RAM, Microsoft Windows 11 Professional 64bit equivalent
Camera optics: 2x 1/3″ CMOS- 2688×1520 Resolution
Video Magnification: Collimated: 30X Micro & 7X Digital Zoom: Standard; 55X Micro Optional; Optional Tableview

Optics: 140X Micro, 7X digital Zoom, 9X Macro & Table View

Power Supply: 480W, 100~240 volts; frequency range 47Hz to 63Hz
Weight: 270 Lbs/ 120 Kg
Programmable XY: Table size: 12″ (305mm) x 12″ (305 mm)

XY Travel: 12″ (305mm) x 12″ (305mm)

Collimated: Stage precision: 10.2um (400uin)

Optics: Stage precision: <2um (80uin)

Internal Dimensions: Height: 229mm (9″), Width: 610mm (24″), Depth: 610mm (24″)

Collimated: Max Z travel: 8.75″

Optics: Max Z travel: 8.5″

External Dimensions: Height: 668mm (26.3″), Width: 711mm (28.0″), Depth: 922mm (36.3″)

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The K Series is a high-precision XRF system designed for diverse sample analysis, featuring a large 12″ x 12″ measurable area, programmable X-Y stage, and auto multi-collimator for flexible spot sizes. Its variable-focus camera (0.25″ to 3.5″) and table view navigation enable effortless measurements. For ultra-small features, the poly-capillary optics version offers 15μm resolution, high-precision stage (2µm), and 140x magnification camera with digital zoom. Equipped with an SDD detector and long-life X-ray tube, it ensures accuracy and compliance with ASTM B568, ISO 3497, and IPC-4552

The O Series combines high performance and ultra-small x-ray spot size (80μm FWHM) using poly-capillary optics, which maximize x-ray flux for higher sensitivity and faster testing of small components or thin coatings. Unlike traditional collimators, this system retains nearly 100% of the tube flux, ensuring superior repeatability in shorter test times. It features a high-resolution SDD detector, 55x video magnification, 7x digital zoom, and a programmable X-Y stage. Due to its close focal distance, samples must be flat. Now available with an extended stage option for greater flexibility.

The G Series XRF is an ideal choice for laboratories and production lines, especially for users with limited workspace, budget constraints, or a preference for "bottom to top" operation with motorized Z-axis control. Designed to efficiently analyze small samples quickly and easily, this system offers flexibility and high performance in material inspection and evaluation.

The Bowman L Series is a versatile XRF instrument with a large sample chamber (22″ x 24″ x 13″) and 10″ x 10″ X-Y stage travel. It accommodates large parts or multiple samples and includes a 4-position collimator assembly, variable focus camera, and programmable X-Y stage. The chamber Z-height is 10″ (or 13″ without the stage). It features an SDD detector and a long-life micro-focus X-ray tube.

The M Series delivers high-performance plating thickness measurement for the smallest features, using advanced poly-capillary optics that focus the x-ray beam down to 7.5μm FWHM. It includes a 140x high-magnification camera with enhanced digital zoom, paired with a secondary macro camera for easy navigation. The high-precision programmable X-Y stage enables multi-point measurements, with automatic pattern recognition and 2D mapping for surface topography analysis. The standard setup features 15μm optics, a high-resolution LSDD detector, and a programmable X-Y stage. Due to its close focal distance, samples must be flat.

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