MICRO XRF (W SERIES)- BOWMAN

Origin: America

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The W Series Micro XRF from Bowman features a 7.5 µm FWHM X-ray beam, the smallest in the world for coating thickness analysis using XRF technology. This makes it ideal for measuring small components like BGAs and solder bumps. It includes a dual-camera system with 140X magnification for precision imaging and a secondary camera for live viewing. A programmable X-Y stage with ±1 µm accuracy, along with pattern recognition and auto-focus, enables precise measurements and automated multi-point analysis. The system also offers 3D mapping for coating topography visualization. Standard configurations include a molybdenum anode tube (with optional chromium or tungsten) and a high-resolution Silicon Drift Detector. The instrument can measure up to five coating layers simultaneously and operates with Archer software, which streamlines measurement, reporting, and application setup.

MODEL: MICRO XRF W SERIES 

SPECIFICATION 

X-ray Excitation: 50 W Mo target Capillary Optics @7.5µm FWHM at 17 KeV

Optional: Cr or W
Detector: Large window Silicon drifted detector with 190eV resolution or better
Output Focal Depth: Fixed at 0.08″ (2.03mm)
Working Environment: 68°F (20°C) to 77°F (25°C) and up to 98% RH, non-condensing
Weight: 190kg (420lbs)
Programmable XYZ: XYZ travel: 300mm (11.8″) x 400mm (15.7″) x 89mm (3.5″)

XY tabletop: 305mm (12″) x 406mm (16″)

XYZ axis precision: 1um (40u”)
Element Range: Aluminum 13 to Uranium 92
Analysis Layers and Elements: 5 layers (4 layers + base) and 10 elements in each layer.

Composition analysis of up to 30 elements simultaneously
Primary Filters: 4 primary filters
Digital Pulse Processing: 4096 CH digital multi-channel analyser with flexible shaping time. Automatic signal processing including dead time correction and escape peak correction
Processor: Intel CORE i5 9th gen. desktop processor, solid state hard drive, 16GB RAM, Microsoft Windows 11 Professional 64bit equivalent
Camera Optics: 1/4″ (6mm) CMOS-1280×720 VGA resolution
Video Magnification: 140X Micro, 7X digital Zoom, 9X Macro & Table View
Power Supply: 150W, 100~240 volts; frequency range 47Hz to 63Hz
Dimensions (H x W x D ): Internal: 102mm (4″) x 914mm (36″) x 737mm (29″)

External: 787mm (31″) x 940mm (37″) x 991mm (39″)
Other New Features: Z axis crash protection array

Auto focus and focus laser

Pattern recognition

Advanced custom data transfer

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MICRO XRF (W SERIES)- BOWMAN

The W Series Micro XRF from Bowman features a 7.5 µm FWHM X-ray beam, the smallest in the world for coating thickness analysis using XRF technology. This makes it ideal for measuring small components like BGAs and solder bumps. It includes a dual-camera system with 140X magnification for precision imaging and a secondary camera for live viewing. A programmable X-Y stage with ±1 µm accuracy, along with pattern recognition and auto-focus, enables precise measurements and automated multi-point analysis. The system also offers 3D mapping for coating topography visualization. Standard configurations include a molybdenum anode tube (with optional chromium or tungsten) and a high-resolution Silicon Drift Detector. The instrument can measure up to five coating layers simultaneously and operates with Archer software, which streamlines measurement, reporting, and application setup.

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