XRF (P SERIES)- BOWMAN

Origin: America

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XRF P Series allows for the measurement of various sample sizes, shapes, and quantities. Its high-precision programmable X-Y stage enables easy operation through software, allowing users to move to measurement locations with a mouse or create multi-point measurement programs with a single click. This optimizes testing for critical areas and larger sample volumes. The standard configuration includes a 4-position collimator assembly, a variable-focus camera for measuring recessed areas, an SDD detector, and a long-life micro-focus X-ray tube. Collimators and focal distances can be customized to suit specific applications.

MODEL: P SERIES

SPECIFICATION

Element Range: Aluminum 13 to Uranium 92
X-ray excitation: 50 W (50kV and 1mA) micro-focused W anode tube
Detector: Silicon solid state detector with 190eV resolution or better
Number of analysis
layers and elements:
5 layers (4 layers + base) and 10 elements in each layer with composition analysis of up to 30 elements simultaneously
Filters/Collimators: 4 primary filters/4 motorized collimator
Focal Depths: Multi fixed focal depths with laser
Digital Pulse Processing: 4096 CH digital multi-channel analyser with flexible shaping time. Automatic signal processing including dead time correction and escape peak correction
Computer: Intel CORE i5 9th gen. desktop processor, solid state hard drive, 16GB RAM, Microsoft Windows 11 Professional 64bit equivalent
Camera optics: 1/4″ (6mm) CMOS-1280×720 VGA resolution
Video Magnification: 30X Micro & 7X Digital Zoom: Standard; 55X Micro: Optional
Power Supply: 150W, 100-240 volts, with frequency range of 47Hz to 63Hz
Weight: 52-70kg
Standard Motorized/ Programmable XY: Table size: 330mm (13″) x 381mm (15″)| Travel: 127mm (5″) x 152mm (6″)
Extended Programmable XY: Table size: 718mm (28.25″) x 610mm (24″) | Travel: 254mm (10″) x 254 (10″)
Now available with extended and Max extended stage option
Max Extended Programmable XY: Table size: 813mm (32″)x 781mm (30.75″)| Travel: 406mm (16″)x 406mm (16″)
Internal Dimensions: Height: 140mm (5.5″), Width: 305mm (12″), Depth: 330mm (13″)
External Dimensions: Height: 457mm (18″), Width: 457mm (18″), Depth: 610mm (24″)

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The W Series Micro XRF from Bowman features a 7.5 µm FWHM X-ray beam, the smallest in the world for coating thickness analysis using XRF technology. This makes it ideal for measuring small components like BGAs and solder bumps. It includes a dual-camera system with 140X magnification for precision imaging and a secondary camera for live viewing. A programmable X-Y stage with ±1 µm accuracy, along with pattern recognition and auto-focus, enables precise measurements and automated multi-point analysis. The system also offers 3D mapping for coating topography visualization. Standard configurations include a molybdenum anode tube (with optional chromium or tungsten) and a high-resolution Silicon Drift Detector. The instrument can measure up to five coating layers simultaneously and operates with Archer software, which streamlines measurement, reporting, and application setup.

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