XRF (M SERIES)- BOWMAN

Origin: America

Brand:

Category: Thương hiệu:

The M Series delivers high-performance plating thickness measurement for the smallest features, using advanced poly-capillary optics that focus the x-ray beam down to 7.5μm FWHM. It includes a 140x high-magnification camera with enhanced digital zoom, paired with a secondary macro camera for easy navigation. The high-precision programmable X-Y stage enables multi-point measurements, with automatic pattern recognition and 2D mapping for surface topography analysis. The standard setup features 15μm optics, a high-resolution LSDD detector, and a programmable X-Y stage. Due to its close focal distance, samples must be flat.

MODEL: XRF M SERIES

SPECIFICATION

X-ray excitation: 50W W-target Capillary Optics @15µm FWHM at 17 KeV

Optional: Cr, Mo, or Rh
Detector: Large window Silicon drifted detector with 190eV resolution or better
Number of analysis layers and elements: 5 layers (4 layers + base) and 10 elements in each layer with composition analysis of up to 30 elements simultaneously
Filters: 4 primary filters
Output Focal Depth: Fixed at 0.15″ (3.81mm)
Digital Pulse Processing: 4096 CH digital multi-channel analyser with flexible shaping time Automatic signal processing including dead time correction and escape peak correction
Computer: Intel CORE i5 9th gen. desktop processor, solid state hard drive, 16GB RAM, Microsoft Windows 11 Professional 64bit equivalent
Camera optics: 1/4″ (6mm) CMOS-1280×720 VGA resolution, 250X with Dual Camera or 45X with Single Camera on 381mm (15″) screen
Video Magnification: 140X Micro, 7X digital Zoom, 9X Macro & Table View
Power Supply: 150W, 100-240 volts, with frequency range of 47Hz to 63Hz
Working Environment: 68°F (20°C) to 77°F (25°C) and up to 98% RH, non-condensing
Weight: 70kg
Programmable XY: Table size: 432 mm (17″) x 406mm (16″) | Travel: 165mm (6.5″) x 165mm (6.5″) high precision
Max Extended Programmable XY: Table size: 813mm (32″)x 781mm (30.75″)| Travel: 406mm (16″)x 406mm (16″)

Now available with max extended stage option
Internal Dimensions: Height: 137mm (5.4″), Width: 305m (12″), Depth: 330mm (13″)
External Dimensions: Height: 508mm (20″), Width: 457mm (18″), Depth: 610mm ( 24″)

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XRF (M SERIES)- BOWMAN

The M Series delivers high-performance plating thickness measurement for the smallest features, using advanced poly-capillary optics that focus the x-ray beam down to 7.5μm FWHM. It includes a 140x high-magnification camera with enhanced digital zoom, paired with a secondary macro camera for easy navigation. The high-precision programmable X-Y stage enables multi-point measurements, with automatic pattern recognition and 2D mapping for surface topography analysis. The standard setup features 15μm optics, a high-resolution LSDD detector, and a programmable X-Y stage. Due to its close focal distance, samples must be flat.

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