XRF (O SERIES)- BOWMAN

Origin: America

Brand:

Category: Thương hiệu:

The O Series combines high performance and ultra-small x-ray spot size (80μm FWHM) using poly-capillary optics, which maximize x-ray flux for higher sensitivity and faster testing of small components or thin coatings. Unlike traditional collimators, this system retains nearly 100% of the tube flux, ensuring superior repeatability in shorter test times. It features a high-resolution SDD detector, 55x video magnification, 7x digital zoom, and a programmable X-Y stage. Due to its close focal distance, samples must be flat. Now available with an extended stage option for greater flexibility.

MODEL: XRF O SERIES

SPECIFICATION

X-ray excitation: 50 W W-target with Capillary Optics @80um FWHM at 17 KeV
Detector: Large window Silicon drifted detector with 190eV resolution or better
Number of analysis layers and elements: 5 layers (4 layers + base) and 10 elements in each layer with composition analysis of up to 30 elements simultaneously
Filters/Collimators: 4 primary filters
Output Focal Depth: Fixed at 0.1″ (2.54mm)
Digital Pulse Processing: 4096 CH digital multi-channel analyser with flexible shaping time Automatic signal processing including dead time correction and escape peak correction
Computer: Intel CORE i5 9th gen. desktop processor, solid state hard drive, 16GB RAM, Microsoft Windows 11 Professional 64bit equivalent
Camera optics: 1/4″ (6mm) CMOS-1280×720 VGA resolution
Video Magnification: 55X Micro with 7X Digital Zoom
Power Supply: 150W, 100-240 volts, with frequency range of 47Hz to 63Hz
Working Environment: 68°F (20°C) to 77°F (25°C) and up to 98% RH, non-condensing
Weight: 52-70kg
Programmable XY: Table size: 330mm (13″) x 381mm (15″)| Travel: 127mm (5″) x 152mm (6″)
Now available with optional extended stages or enclosed chamber
Internal Dimensions: Height: 140mm (5.5″), Width: 305mm (12″), Depth: 330mm (13″)
External Dimensions: Height: 457mm (18″), Width: 457mm (18″), Depth: 610mm (24″)

Related products

XRF

XRF (K SERIES)- BOWMAN

The K Series is a high-precision XRF system designed for diverse sample analysis, featuring a large 12″ x 12″ measurable area, programmable X-Y stage, and auto multi-collimator for flexible spot sizes. Its variable-focus camera (0.25″ to 3.5″) and table view navigation enable effortless measurements. For ultra-small features, the poly-capillary optics version offers 15μm resolution, high-precision stage (2µm), and 140x magnification camera with digital zoom. Equipped with an SDD detector and long-life X-ray tube, it ensures accuracy and compliance with ASTM B568, ISO 3497, and IPC-4552

XRF

MICRO XRF (A SERIES)- BOWMAN

The A Series MICRO XRF is designed for precise measurement of the smallest X-ray features in semiconductors and microelectronics. The system supports large PCBs and wafers of any size, with a 7.5 μm FWHM X-ray beam—the smallest in the world for XRF. A dual-camera system with 140X magnification provides detailed imaging, while a programmable X-Y stage moves up to 600 mm with ±1 μm precision. Pattern recognition, auto-focus, and 3D mapping optimize measurement accuracy.

XRF

XRF (L SERIES)- BOWMAN

The Bowman L Series is a versatile XRF instrument with a large sample chamber (22″ x 24″ x 13″) and 10″ x 10″ X-Y stage travel. It accommodates large parts or multiple samples and includes a 4-position collimator assembly, variable focus camera, and programmable X-Y stage. The chamber Z-height is 10″ (or 13″ without the stage). It features an SDD detector and a long-life micro-focus X-ray tube.

XRF

XRF (M SERIES)- BOWMAN

The M Series delivers high-performance plating thickness measurement for the smallest features, using advanced poly-capillary optics that focus the x-ray beam down to 7.5μm FWHM. It includes a 140x high-magnification camera with enhanced digital zoom, paired with a secondary macro camera for easy navigation. The high-precision programmable X-Y stage enables multi-point measurements, with automatic pattern recognition and 2D mapping for surface topography analysis. The standard setup features 15μm optics, a high-resolution LSDD detector, and a programmable X-Y stage. Due to its close focal distance, samples must be flat.

XRF

XRF (G SERIES) – BOWMAN

The G Series XRF is an ideal choice for laboratories and production lines, especially for users with limited workspace, budget constraints, or a preference for "bottom to top" operation with motorized Z-axis control. Designed to efficiently analyze small samples quickly and easily, this system offers flexibility and high performance in material inspection and evaluation.

XRF

XRF (P SERIES)- BOWMAN

XRF P Series allows for the measurement of various sample sizes, shapes, and quantities. Its high-precision programmable X-Y stage enables easy operation through software, allowing users to move to measurement locations with a mouse or create multi-point measurement programs with a single click. This optimizes testing for critical areas and larger sample volumes. The standard configuration includes a 4-position collimator assembly, a variable-focus camera for measuring recessed areas, an SDD detector, and a long-life micro-focus X-ray tube. Collimators and focal distances can be customized to suit specific applications.

XRF

XRF (B SERIES)- BOWMAN

The B Series is a basic XRF measurement system with a top-down design for easy operation. It features a fixed sample stage, requiring users to manually align the test position using video imaging. The sample chamber is similar to the P Series but without a programmable X-Y stage. The system includes a fixed collimator, fixed-focus camera, SDD detector, and a durable micro-focus X-ray tube. Notably, the B Series can be upgraded with additional collimators or a variable-focus camera to enhance analytical flexibility.

XRF

MICRO XRF (W SERIES)- BOWMAN

The W Series Micro XRF from Bowman features a 7.5 µm FWHM X-ray beam, the smallest in the world for coating thickness analysis using XRF technology. This makes it ideal for measuring small components like BGAs and solder bumps. It includes a dual-camera system with 140X magnification for precision imaging and a secondary camera for live viewing. A programmable X-Y stage with ±1 µm accuracy, along with pattern recognition and auto-focus, enables precise measurements and automated multi-point analysis. The system also offers 3D mapping for coating topography visualization. Standard configurations include a molybdenum anode tube (with optional chromium or tungsten) and a high-resolution Silicon Drift Detector. The instrument can measure up to five coating layers simultaneously and operates with Archer software, which streamlines measurement, reporting, and application setup.

Sản phẩm đã xem

XRF (O SERIES)- BOWMAN

The O Series combines high performance and ultra-small x-ray spot size (80μm FWHM) using poly-capillary optics, which maximize x-ray flux for higher sensitivity and faster testing of small components or thin coatings. Unlike traditional collimators, this system retains nearly 100% of the tube flux, ensuring superior repeatability in shorter test times. It features a high-resolution SDD detector, 55x video magnification, 7x digital zoom, and a programmable X-Y stage. Due to its close focal distance, samples must be flat. Now available with an extended stage option for greater flexibility.

XRF (G SERIES) – BOWMAN

The G Series XRF is an ideal choice for laboratories and production lines, especially for users with limited workspace, budget constraints, or a preference for "bottom to top" operation with motorized Z-axis control. Designed to efficiently analyze small samples quickly and easily, this system offers flexibility and high performance in material inspection and evaluation.

XRF (L SERIES)- BOWMAN

The Bowman L Series is a versatile XRF instrument with a large sample chamber (22″ x 24″ x 13″) and 10″ x 10″ X-Y stage travel. It accommodates large parts or multiple samples and includes a 4-position collimator assembly, variable focus camera, and programmable X-Y stage. The chamber Z-height is 10″ (or 13″ without the stage). It features an SDD detector and a long-life micro-focus X-ray tube.

XRF (M SERIES)- BOWMAN

The M Series delivers high-performance plating thickness measurement for the smallest features, using advanced poly-capillary optics that focus the x-ray beam down to 7.5μm FWHM. It includes a 140x high-magnification camera with enhanced digital zoom, paired with a secondary macro camera for easy navigation. The high-precision programmable X-Y stage enables multi-point measurements, with automatic pattern recognition and 2D mapping for surface topography analysis. The standard setup features 15μm optics, a high-resolution LSDD detector, and a programmable X-Y stage. Due to its close focal distance, samples must be flat.

error: Content is protected !!