The EDX-B3T/B6T Coating Thickness XRF is specially designed for analyzing coating composition and accurately measuring coating thickness. The system irradiates the sample with X-rays and determines coating thickness by measuring the intensity of secondary X-rays emitted from the sample, enabling completely non-destructive analysis. Key advantages include high accuracy, fast measurement, non-destructive testing, and easy operation. It can simultaneously measure the thickness of up to five coating layers and quickly identify the composition of coating materials, making it an efficient solution for coating analysis and quality control.
This series are primarily utilized for material elemental composition analysis across all stages of complete mining process.
The B Series is a basic XRF measurement system with a top-down design for easy operation. It features a fixed sample stage, requiring users to manually align the test position using video imaging. The sample chamber is similar to the P Series but without a programmable X-Y stage. The system includes a fixed collimator, fixed-focus camera, SDD detector, and a durable micro-focus X-ray tube. Notably, the B Series can be upgraded with additional collimators or a variable-focus camera to enhance analytical flexibility.
The G Series XRF is an ideal choice for laboratories and production lines, especially for users with limited workspace, budget constraints, or a preference for "bottom to top" operation with motorized Z-axis control. Designed to efficiently analyze small samples quickly and easily, this system offers flexibility and high performance in material inspection and evaluation.
The K Series is a high-precision XRF system designed for diverse sample analysis, featuring a large 12″ x 12″ measurable area, programmable X-Y stage, and auto multi-collimator for flexible spot sizes. Its variable-focus camera (0.25″ to 3.5″) and table view navigation enable effortless measurements. For ultra-small features, the poly-capillary optics version offers 15μm resolution, high-precision stage (2µm), and 140x magnification camera with digital zoom. Equipped with an SDD detector and long-life X-ray tube, it ensures accuracy and compliance with ASTM B568, ISO 3497, and IPC-4552
The Bowman L Series is a versatile XRF instrument with a large sample chamber (22″ x 24″ x 13″) and 10″ x 10″ X-Y stage travel. It accommodates large parts or multiple samples and includes a 4-position collimator assembly, variable focus camera, and programmable X-Y stage. The chamber Z-height is 10″ (or 13″ without the stage). It features an SDD detector and a long-life micro-focus X-ray tube.
XRF P Series allows for the measurement of various sample sizes, shapes, and quantities. Its high-precision programmable X-Y stage enables easy operation through software, allowing users to move to measurement locations with a mouse or create multi-point measurement programs with a single click. This optimizes testing for critical areas and larger sample volumes. The standard configuration includes a 4-position collimator assembly, a variable-focus camera for measuring recessed areas, an SDD detector, and a long-life micro-focus X-ray tube. Collimators and focal distances can be customized to suit specific applications.