Park FX40 is Park Systems’ latest innovation in atomic force microscopy (AFM), designed for high-resolution imaging of small samples. With a low noise floor, minimal thermal drift, and enhanced mechanical stability, the FX40 delivers unmatched precision and reliability. Like all Park AFMs, FX40 features an orthogonal scan system and True Non-contact™ mode, enabling accurate, high-resolution metrology, even on the most delicate or fragile samples. Key features of FX40 include automatic probe exchange, automatic laser beam alignment, and a sample-view camera; the signatures of FX-series AFMs that streamline operation while significantly enhancing productivity. With the powerful FX AFM controller featuring an 8-channel lock-in amplifier and 5 MHz bandwidth for advanced signal processing, FX40 supports a wide range of cutting-edge modes and options. Built for both precision and ease of use, the FX40 is the ideal solution for nanoscale imaging and analysis.