The Raman-SEM microscope is the world’s first fully integrated system combining Raman spectroscopy and Scanning Electron Microscopy (SEM) in a single instrument. With its novel correlative microscopy approach, RISE merges the ultrastructural surface analysis capability of SEM with molecular compound information from confocal Raman imaging. The system enables seamless switching between Raman and SEM measurements, supported by a user-friendly software interface for intuitive control. The RISE microscope not only maintains the full performance of both techniques but also provides precise correlation between the measurement results.
For the user with challenging experimental requirements, the alpha300 RS facilitates confocal Raman imaging in combination with Scanning Near-field Optical Microscopy for optical imaging with resolution beyond the diffraction limit. It combines all features of the alpha300 S and alpha300 R and many AFM operation modes. Furthermore the combined Raman-SNOM microscope is ideally suited for high-resolution Raman imaging techniques such as nearfield-Raman imaging.