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Park FX40 is Park Systems’ latest innovation in atomic force microscopy (AFM), designed for high-resolution imaging of small samples. With a low noise floor, minimal thermal drift, and enhanced mechanical stability, the FX40 delivers unmatched precision and reliability. Like all Park AFMs, FX40 features an orthogonal scan system and True Non-contact™ mode, enabling accurate, high-resolution metrology, even on the most delicate or fragile samples. Key features of FX40 include automatic probe exchange, automatic laser beam alignment, and a sample-view camera; the signatures of FX-series AFMs that streamline operation while significantly enhancing productivity. With the powerful FX AFM controller featuring an 8-channel lock-in amplifier and 5 MHz bandwidth for advanced signal processing, FX40 supports a wide range of cutting-edge modes and options. Built for both precision and ease of use, the FX40 is the ideal solution for nanoscale imaging and analysis.
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Park NX10 is a flagship atomic force microscope (AFM) designed for small-sample research, delivering unmatched accuracy, reliability, and ease of use. As Park Systems’ original small-sample AFM, it has earned global recognition in both academic and industrial laboratories for producing precise, repeatable nanoscale measurements. At the core of the NX10 are Park’s proprietary orthogonal scan system and True Non-contact™ mode, innovations that virtually eliminate lateral motion artifacts while protecting both tip and sample. Together, these technologies ensure artifact-free, high-resolution imaging even for the most delicate or challenging samples. From materials science to polymers and bioengineering, NX10 delivers robust performance and dependable results, making it a trusted platform for advanced nanoscale metrology.
The alpha300 apyron is an advanced Raman microscope system that fully automates the control and measurement processes, saving time and enhancing accuracy. With automated measurement capabilities and high-level optimization, the alpha300 apyron delivers Raman images with exceptional sensitivity and resolution, making it an ideal solution for material research and analytical applications.
High-sensitivity piezoresponse imaging using dual-frequency resonance tracking for precise analysis of complex domain structures and electromechanical behavior.
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High-resolution surface imaging of samples without physical contact, minimizing damage during scanning.
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In this alternative technique to non-contact mode, the cantilever again oscillates just above the surface, but at a much higher amplitude of oscillation. The bigger oscillation makes the deflection signal large enough for the control circuit, and hence an easier control for topography feedback. It produces modest AFM results but blunts the tip’s sharpness at a higher rate, ultimately speeding up the loss of its imaging resolution.
High-resolution surface imaging of samples without physical contact, minimizing damage during scanning.
The Raman Imaging Microscope – alpha300 R is an advanced instrument that integrates optical microscopy with Raman spectroscopy technology, offering exceptional performance in sensitivity, resolution, and speed. This system enables hyperspectral imaging with complete Raman spectral information at every pixel, making it ideal for 3D imaging and depth profiling. Equipped with an optimized optical system and UHTS (Ultra-High Throughput Spectrometer) designed for low-light intensity applications, this microscope provides a non-destructive and highly precise solution for demanding research without compromising the integrity of the sample.